Ключевые слова:
Testing conditions, Electrical properties and phenomena, Electrical insulation, Leakage currents, Electrical measurement, Time, Temperature, Semiconductor devices, Graphic symbols, Capacitance, Voltage, Electrical resistance, Dissipation factor, Voltage measurement, Circuits, Ratings, Thermal resistance, Response time, Transistors, Electrical safety, Integrated circuits, Current measurement, Symbols, Bipolar transistors, Electric current, Rated current, Rated voltage, Rated power, Electronic equipment and components