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BS ISO 23830:2008
Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
24 стр.
Действует
Печатная копияПечатное издание
257.04 £ (включая НДС 20%)
Разработчик:
Зарубежные/BSI
ICS:
71.040.40 Chemical. Including analysis of gases and surface chemical analysis / Химический анализ. Включая анализ газов
Ключевые слова:
Surface chemistry, Ions, Reproducibility, Chemical analysis and testing, Secondary, Mass spectrometers, Mass spectrometry, Measurement characteristics