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IEC 60749-23:2004 ed1.0
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
17 стр.
Действует
Электронный (pdf)Печатная копия
65.52 CHF (включая НДС 20%)
Разработчик:
Зарубежные/IEC
ICS:
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом
Описание
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.