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IEC 60749-36:2003 ed1.0
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
7 стр.
Действует
Электронный (pdf)Печатная копия
16.38 CHF (включая НДС 20%)
Разработчик:
Зарубежные/IEC
ICS:
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом
Описание
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.