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IEC 60749-6:2002 ed1.0
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
7 стр.
Заменен
Электронный (pdf)Печатная копия
16.38 CHF (включая НДС 20%)
Разработчик:
Зарубежные/IEC
ICS:
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом
Описание
Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive.The contents of the corrigendum of August 2003 have been included in this copy.