(812) 309-78-59
(495) 223-46-76
IEC 61649:1997 ed1.0
Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data
31 стр.
Заменен
Электронный (pdf)Печатная копия
131.04 CHF (включая НДС 20%)
Разработчик:
Зарубежные/IEC
ICS:
03.120.30 Application of statistical methods / Применение статистических методов03.120.01 Quality. Including general aspects related to reliability and maintainability / Качество в целом. Включая общие аспекты, связанные с надежностью и ремонтопригодностью
Описание
Provides numerical methods to complement graphical techniques in performing a goodness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence intervals for the parameters of the two-parameter Weibull distribution when these are estimated by maximum likelihood. Applicable whenever a random sample of items is subjected to a test of times to failure for the purpose of estimating measures of reliability performance of the population from which these items were drawn.