(812) 309-78-59
(495) 223-46-76
IEC 61967-4:2002 ed1.0
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method
57 стр.
Заменен
Печатная копияЭлектронный (pdf)
311.22 CHF (включая НДС 20%)
Разработчик:
Зарубежные/IEC
ICS:
31.200 Integrated. Including electronic chips, logical and analogue microstructures / Интегральные схемы. Микроэлектроника. Включая электронные микросхемы, логические и аналоговые микроструктуры
Описание
Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements.
The contents of the corrigendum 1 of June 2017 have been included in this copy.