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IEC PAS 62171:2000 ed1.0
Guidelines for particle impact noise detection (PIND) testing, operator training and certification
41 стр.
Заменен
Электронный (pdf)Печатная копия
442.26 CHF (включая НДС 20%)
Разработчик:
Зарубежные/IEC
ICS:
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом
Описание
Aims at disseminating and sharing the relevant information on PIND testing to all interested parties. The concepts and materials presented here primarily deal with most of the cause factors that affect the "Measurement Variability" pertinent to PIND and how to control them.