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ASTM E1127-91(1997)

Заменен
Standard Guide for Depth Profiling in Auger Electron Spectroscopy — 4 стр.
Область применения

1.1 This guide covers procedures used for depth profiling in Auger electron spectroscopy.

1.2 Guidelines are given for depth profiling by the following:

Section Ion Sputtering 6 Angle Lapping and Cross-Sectioning 7 Mechanical Cratering 8 Nondestructive Depth Profiling 9

1.3 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ICS
71.040.50 Physicochemical. Including spectrophotometric and chromatographic analysis / Физико-химические методы анализа. Включая спектрофотометрический и хроматографический анализы
Сборник ASTM
03.06 Molecular Spectroscopy and Separation Science; Surface Analysis / Молекулярная спектроскопия; Анализ поверхности
Тематика
Spectroscopy