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ASTM E1249-10

Заменен
Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources — 17 стр.
ОписаниеСсылкиВерсии

Ссылочные документы

ASTM E1250-10
Заменен
Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices — 10 стр.
ASTM E668-13
Заменен
Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices — 19 стр.
ASTM E666-14
Заменен
Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation — 9 стр.
ASTM E170-15
Заменен
Standard Terminology Relating to Radiation Measurements and Dosimetry — 10 стр.
ASTM E1249-15
Заменен
Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources — 17 стр.
ASTM E1249-00(2005)
Заменен
Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources — 16 стр.

На этот документ ссылаются

ASTM E666-09
Заменен
Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation — 9 стр.
ASTM E1249-00(2005)
Заменен
Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources — 16 стр.
ASTM E1854-07
Заменен
Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts — 16 стр.
ASTM E1249-15
Заменен
Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources — 17 стр.
ASTM F1892-06
Заменен
Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices — 40 стр.
ASTM F1467-99(2005)e1
Заменен
Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits — 18 стр.
ASTM F1467-99(2005)
Заменен
Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits — 18 стр.
ASTM E1894-13
Заменен
Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources — 19 стр.
ASTM E1894-08
Заменен
Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources — 19 стр.
ASTM F1190-99(2005)
Заменен
Standard Guide for Neutron Irradiation of Unbiased Electronic Components — 5 стр.
ASTM F996-10
Заменен
Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics — 7 стр.
ASTM E1250-10
Заменен
Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices — 10 стр.