ASTM E1249-10

Заменен

Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources — 17 стр.

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Ссылочные документы

ASTM E1250-10

Заменен

Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices — 10 стр.

ASTM E668-13

Заменен

Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices — 19 стр.

ASTM E666-14

Заменен

Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation — 9 стр.

ASTM E170-15

Заменен

Standard Terminology Relating to Radiation Measurements and Dosimetry — 10 стр.

ASTM E1249-15

Заменен

Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources — 17 стр.

ASTM E1249-00(2005)

Заменен

Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources — 16 стр.

На этот документ ссылаются

ASTM E666-09

Заменен

Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation — 9 стр.

ASTM E1250-10

Заменен

ASTM E1249-00(2005)

Заменен

Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources — 16 стр.

ASTM E1854-07

Заменен

Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts — 16 стр.

ASTM E1249-15

Заменен

Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources — 17 стр.

ASTM F1892-06

Заменен

Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices — 40 стр.

ASTM F1467-99(2005)e1

Заменен

Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits — 18 стр.

ASTM F1467-99(2005)

Заменен

Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits — 18 стр.

ASTM F996-10

Заменен

Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics — 7 стр.

ASTM E1894-13

Заменен

Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources — 19 стр.

ASTM E1894-08

Заменен

Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources — 19 стр.

ASTM F1190-99(2005)

Заменен

Standard Guide for Neutron Irradiation of Unbiased Electronic Components — 5 стр.