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ASTM E1249-15

Заменен
Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources — 17 стр.
ОписаниеСсылкиВерсии

Ссылочные документы

ASTM E170-20
Заменен
Standard Terminology Relating to Radiation Measurements and Dosimetry — 12 стр.
ASTM E1250-15(2020)
Действует
Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices — 10 стр.
ASTM E666-14
Заменен
Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation — 9 стр.
ASTM E668-20
Действует
Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices — 19 стр.
ASTM E1249-15(2021)
Действует
Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources — 17 стр.
ASTM E1249-10
Заменен
Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources — 17 стр.

На этот документ ссылаются

BS ISO 15572:1998
Действует
Guide for estimating uncertainties in dosimetry for radiation processing — 28 стр.
BS ISO 15560:1998
Действует
Practice for characterization and performance of a high-dose radiation dosimetry calibration laboratory — 16 стр.
18/30374539 DC
Действует
BS EN 60749-18. Semiconductor devices. Mechanical and climatic test methods. Part 18. Ionizing radiation (total dose) — 22 стр.
ASTM E1249-10
Заменен
Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources — 17 стр.
ASTM E1854-13
Заменен
Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts — 13 стр.
ASTM F1467-11
Заменен
Standard Guide for Use of an X-Ray Tester (<span class='unicode'>"48;</span>10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits — 18 стр.
ASTM F1892-12
Заменен
Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices — 41 стр.
ASTM E1894-13a
Заменен
Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources — 19 стр.
ASTM E1249-15(2021)
Действует
Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources — 17 стр.
ASTM F1190-11
Заменен
Standard Guide for Neutron Irradiation of Unbiased Electronic Components — 6 стр.
ASTM F996-11
Заменен
Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics — 7 стр.
ASTM E1250-15
Заменен
Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices — 10 стр.