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СтандартыASTM

ASTM E1894-08

Заменен
Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources — 19 стр.
ОписаниеСсылкиВерсии

Ссылочные документы

ASTM E170-10
Заменен
Standard Terminology Relating to Radiation Measurements and Dosimetry — 9 стр.
ASTM E665-94
Отменен
Practice for Using Absorbed Dose Versus Depth in Materials to Verify the X-ray Output of Flash X-ray Machines (Withdrawn 2000) — 4 стр.
ASTM E666-09
Заменен
Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation — 9 стр.
ASTM E668-13
Заменен
Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices — 19 стр.
ASTM E1249-10
Заменен
Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources — 17 стр.
ASTM E1894-13
Заменен
Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources — 19 стр.
ASTM E1894-97(2002)
Заменен
Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources — 17 стр.

На этот документ ссылаются

ASTM F1467-99(2005)e1
Заменен
Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits — 18 стр.
ASTM F1467-99(2005)
Заменен
Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits — 18 стр.
ASTM F1467-99
Заменен
Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits — 17 стр.
ASTM F980-92
Заменен
Guide for The Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices — 5 стр.
ASTM E1894-97(2002)
Заменен
Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources — 17 стр.
ASTM E1894-13
Заменен
Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources — 19 стр.
ASTM F996-10
Заменен
Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics — 7 стр.
ASTM F996-98
Заменен
Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics — 6 стр.
ASTM F996-98(2003)
Заменен
Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics — 7 стр.