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ASTM E2246-11e1

Заменен
Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer — 21 стр.
Значение и использование

5.1 Strain gradient values are an aid in the design and fabrication of MEMS devices.

Область применения

1.1 This test method covers a procedure for measuring the strain gradient in thin, reflecting films. It applies only to films, such as found in microelectromechanical systems (MEMS) materials, which can be imaged using an optical interferometer, also called an interferometric microscope. Measurements from cantilevers that are touching the underlying layer are not accepted.

1.2 This test method uses a non-contact optical interferometric microscope with the capability of obtaining topographical 3-D data sets. It is performed in the laboratory.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ICS
37.040.20 Photographic paper, films and plates. Cartridges / Фотографическая бумага, пленки и картриджи
Сборник ASTM
03.01 Metals -- Mechanical Testing; Elevated and Low-Temperature Tests; Metallography / Металлы - Механические испытания, Испытания при высоких и низких температурах, Металлография
Тематика
Fatigue & Fracture