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ASTM E427-95(2006)

Отменен
Standard Practice for Testing for Leaks Using the Halogen Leak Detector(Alkali-Ion Diode) (Withdrawn 2013) — 7 стр.
Причина отмены

This practice covered procedures for testing and locating the sources of gas leaking at the rate of 2.2  × 10−14 mol/s (5 × 10−10 Std cm3/s). The test may have been conducted on any device or component across which a pressure differential of halogen tracer gas may have been created, and on which the effluent side of the area to be leak tested was accessible for probing with the halogen leak detector.

Formerly under the jurisdiction of Committee E07 on Nondestructive Testing, this practice was withdrawn in June 2013 in accordance with section 10.6.3.1 of the Regulations Governing ASTM Technical Committees, which requires that standards shall be updated by the end of the eighth year since the last approval date.

Значение и использование

Halogen leak testing can be used to indicate the presence, location and magnitude of leaks in a closed vessel. This test method is normally used for production examination. Its use with halogenated refrigerant gases has been declining because of concerns about the effect of these gases on the ozone layer.

Область применения

1.1 This practice covers procedures for testing and locating the sources of gas leaking at the rate of 2.2 10 14 mol/s (5 1010 Std cm3/s). The test may be conducted on any device or component across which a pressure differential of halogen tracer gas may be created, and on which the effluent side of the area to be leak tested is accessible for probing with the halogen leak detector.

1.2 Five methods are described:

1.2.1 Method A - Direct probing with no significant halogen contamination in the atmosphere.

1.2.2 Method B - Direct probing with significant halogen contamination in the atmosphere.

1.2.3 Method C - Shroud test.

1.2.4 Method D - Air-curtain shroud test.

1.2.5 Method E Accumulation test.

1.3 The values stated in inch-pound units are to be regarded as the standard. The metric equivalents of inch-pound units may be approximate.

This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ICS
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом
Сборник ASTM
03.03 Nondestructive Testing (I): C1331 – E2373 / Неразрушающий контроль (I): C1331 – E2373
Тематика
Nondestructive Testing