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ASTM E665-94

Отменен
Practice for Using Absorbed Dose Versus Depth in Materials to Verify the X-ray Output of Flash X-ray Machines (Withdrawn 2000) — 4 стр.
ОписаниеСсылкиВерсии

Ссылочные документы

ASTM E665-94
Отменен
Practice for Using Absorbed Dose Versus Depth in Materials to Verify the X-ray Output of Flash X-ray Machines (Withdrawn 2000) — 4 стр.
ASTM D2568-70
Заменен
Recommended Practice for Calculation of Absorbed Dose from Gamma Radiation (Withdrawn 1979) — 0 стр.

На этот документ ссылаются

ASTM E1854-03
Заменен
Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts — 16 стр.
ASTM E1854-05
Заменен
Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts — 16 стр.
ASTM E1854-07
Заменен
Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts — 16 стр.
ASTM E1854-96
Заменен
Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts — 16 стр.
ASTM D2568-70
Заменен
Recommended Practice for Calculation of Absorbed Dose from Gamma Radiation (Withdrawn 1979) — 0 стр.
ASTM E665-94
Отменен
Practice for Using Absorbed Dose Versus Depth in Materials to Verify the X-ray Output of Flash X-ray Machines (Withdrawn 2000) — 4 стр.
ASTM F744M-97(2003)
Заменен
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric] — 6 стр.
ASTM F744M-97
Заменен
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits — 6 стр.
ASTM F744M-10
Заменен
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric] — 7 стр.
ASTM E1894-97(2002)
Заменен
Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources — 17 стр.
ASTM E1894-08
Заменен
Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources — 19 стр.
ASTM E1894-97
Заменен
Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources — 17 стр.