ASTM E666-14

Заменен

Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation — 9 стр.

Ссылочные документы

ASTM E1249-15(2021)

Действует

Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources — 17 стр.

ASTM E170-20

Заменен

Standard Terminology Relating to Radiation Measurements and Dosimetry — 12 стр.

ASTM E668-20

Действует

Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices — 19 стр.

ASTM E666-21

Действует

Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation — 9 стр.

ASTM E666-09

Заменен

Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation — 9 стр.

На этот документ ссылаются

BS ISO 15572:1998

Действует

Guide for estimating uncertainties in dosimetry for radiation processing — 28 стр.

BS ISO 15571:1998

Действует

Practice for dosimetry in a gamma irradiation facility for radiation processing — 14 стр.

BS ISO 15570:1998

Действует

Practice for use of cellulose acetate dosimetry system — 16 стр.

BS ISO 15568:1998

Действует

Practice for use of calorimetric dosimetry systems for electron beam dose measurements and dosimeter calibrations — 16 стр.

BS ISO 15565:1998

Действует

Practice for use of a radiochromic liquid dosimetry system — 14 стр.

BS ISO 15563:1998

Действует

Practice for use of the ethanol-chlorobenzene dosimetry system — 16 стр.

BS ISO 15561:1998

Действует

Practice for use of a dichromate dosimetry system — 14 стр.

BS ISO 15559:1998

Действует

Practice for use of a radiochromic optical waveguide dosimetry system — 12 стр.

BS ISO 15556:1998

Действует

Guide for selection and calibration of dosimetry systems for radiation processing — 20 стр.

BS ISO 15555:1998

Действует

Practice for use of a ceric-cerous sulfate dosimetry system — 16 стр.

BS ISO 15554:1998

Действует

Practice for dosimetry in gamma irradiation facilities for food processing — 14 стр.

18/30374539 DC

Действует

BS EN 60749-18. Semiconductor devices. Mechanical and climatic test methods. Part 18. Ionizing radiation (total dose) — 22 стр.

ASTM E666-09

Заменен

Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation — 9 стр.

ASTM E1819-10

Заменен

Standard Guide for Environmental Monitoring Plans for Decommissioning of Nuclear Facilities — 9 стр.

ASTM E668-13

Заменен

Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices — 19 стр.

ASTM E1249-10

Заменен

Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources — 17 стр.

ASTM E1854-13

Заменен

Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts — 13 стр.

ASTM E1249-15

Заменен

Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources — 17 стр.

ASTM E1819-15

Заменен

Standard Guide for Environmental Monitoring Plans for Decommissioning of Nuclear Facilities — 9 стр.

ASTM F1262M-95(2008)

Заменен

Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) — 5 стр.

ASTM E2450-11

Заменен

Standard Practice for Application of CaF<sub>2</sub>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments — 6 стр.

ASTM D1879-06

Заменен

Standard Practice for Exposure of Adhesive Specimens to Ionizing Radiation — 4 стр.

ASTM F1467-11

Заменен

Standard Guide for Use of an X-Ray Tester (<span class='unicode'>"48;</span>10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits — 18 стр.

ASTM F1892-12

Заменен

Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices — 41 стр.

ASTM F773M-10

Заменен

Practice for Measuring Dose Rate Response of Linear Integrated Circuits [Metric] — 6 стр.

ASTM F980-10e1

Заменен

Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices — 7 стр.

ASTM F980-10

Заменен

Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices — 5 стр.

ASTM E1894-13a

Заменен

Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources — 19 стр.

ASTM E666-21

Действует

Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation — 9 стр.

ASTM F744M-10

Заменен

Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric] — 7 стр.

ASTM F996-11

Заменен

Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics — 7 стр.

ASTM E1161-09

Заменен

Standard Practice for Radiologic Examination of Semiconductors and Electronic Components — 10 стр.