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ASTM E673-01

Заменен
Standard Terminology Relating to Surface Analysis — 10 стр.
Область применения

1.1 This terminology is related to the various disciplines involved in surface analysis.

1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).

ICS
17.040.20 Properties of surfaces / Свойства поверхностей
01.040.17 Metrology and measurement. Physical phenomena (Vocabularies) / Метрология и измерения. Физические явления (Словари)
Сборник ASTM
03.06 Molecular Spectroscopy and Separation Science; Surface Analysis / Молекулярная спектроскопия; Анализ поверхности
Тематика
Spectroscopy