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ASTM
ASTM E996-10
Заменен
Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
— 3 стр.
Описание
Ссылки
Версии
Ссылочные документы
ASTM E995-16
Действует
Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
— 6 стр.
ASTM E983-10
Заменен
Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
— 4 стр.
ASTM E902-05
Отменен
Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers (Withdrawn 2011)
— 4 стр.
ASTM E673-03
Отменен
Standard Terminology Relating to Surface Analysis (Withdrawn 2012)
— 10 стр.
ASTM E1078-14
Заменен
Standard Guide for Specimen Preparation and Mounting in Surface Analysis
— 10 стр.
ASTM E1127-08(2015)
Заменен
Standard Guide for Depth Profiling in Auger Electron Spectroscopy (Withdrawn 2024)
— 5 стр.
ASTM E996-10(2018)
Заменен
Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
— 3 стр.
ASTM E996-04
Заменен
Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
— 3 стр.
На этот документ ссылаются
PD ISO/TR 18196:2016
Действует
Nanotechnologies. Measurement technique matrix for the characterization of nano-objects
— 66 стр.
ASTM E995-04
Заменен
Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
— 4 стр.
ASTM E996-04
Заменен
Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
— 3 стр.
ASTM E1577-04
Заменен
Standard Guide for Reporting of Ion Beam Parameters Used in Surface Analysis
— 3 стр.
ASTM E984-06
Заменен
Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy
— 4 стр.
ASTM E996-10(2018)
Заменен
Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
— 3 стр.
ASTM E983-10
Заменен
Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
— 4 стр.
ASTM F2150-07
Заменен
Standard Guide for Characterization and Testing of Biomaterial Scaffolds Used in Tissue-Engineered Medical Products
— 10 стр.
ASTM F2847-10
Заменен
Standard Practice for Reporting and Assessment of Residues on Single Use Implants
— 9 стр.
ASTM E2735-13
Заменен
Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
— 6 стр.
ASTM E1127-08
Заменен
Standard Guide for Depth Profiling in Auger Electron Spectroscopy
— 5 стр.