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ASTM F1259M-96(2003)

Отменен
Standard Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration [Metric] (Withdrawn 2009) — 2 стр.
ОписаниеСсылкиВерсии

Ссылочные документы

ASTM F1260M-96(2003)
Отменен
Standard Test Method for Estimating Electromigration Median Time-to-Failure and Sigma of Integrated Circuit Metallizations [Metric] (Withdrawn 2009) — 8 стр.
ASTM F1261M-96(2003)
Отменен
Standard Test Method for Determining the Average Electrical Width of a Straight, Thin-Film Metal Line [Metric] (Withdrawn 2009) — 4 стр.
ASTM F1259M-96(2003)
Отменен
Standard Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration [Metric] (Withdrawn 2009) — 2 стр.
ASTM F1259M-96
Заменен
Standard Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration [Metric] — 2 стр.

На этот документ ссылаются

ASTM F1260M-96
Заменен
Standard Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations [Metric] — 8 стр.
ASTM F1259M-96(2003)
Отменен
Standard Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration [Metric] (Withdrawn 2009) — 2 стр.
ASTM F1259M-96
Заменен
Standard Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration [Metric] — 2 стр.
ASTM F1260M-96(2003)
Отменен
Standard Test Method for Estimating Electromigration Median Time-to-Failure and Sigma of Integrated Circuit Metallizations [Metric] (Withdrawn 2009) — 8 стр.