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ASTM F1260M-96

Заменен
Standard Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations [Metric] — 8 стр.
ASTM F1260-89
Отменен
ASTM F1260M-96
Заменен
ASTM F1260M-96(2003)
Отменен