ASTM F1262M-14

Отменен

Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) (Withdrawn 2023) — 6 стр.

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Ссылочные документы

ASTM F1893-18

Отменен

Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices (Withdrawn 2023) — 7 стр.

ASTM E668-20

Действует

Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices — 19 стр.

ASTM E666-21

Действует

Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation — 9 стр.

ASTM F1262M-14

Отменен

Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) (Withdrawn 2023) — 6 стр.

ASTM F1262M-95(2008)

Заменен

Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) — 5 стр.

На этот документ ссылаются

ASTM F1262M-95(2008)

Заменен

Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) — 5 стр.

ASTM F1262M-95(2002)

Заменен

Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits — 5 стр.

ASTM F1262M-14

Отменен

Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) (Withdrawn 2023) — 6 стр.

ASTM F1262M-95

Заменен

Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits — 5 стр.