ASTM F16-12(2022)

Отменен

Standard Test Methods for Measuring Diameter or Thickness of Wire and Ribbon for Electronic Devices and Lamps (Withdrawn 2023) — 5 стр.

Ссылочные документы

Отменен

Standard Test Methods for Measuring Diameter or Thickness of Wire and Ribbon for Electronic Devices and Lamps (Withdrawn 2023) — 5 стр.

Заменен

Standard Test Methods for Measuring Diameter or Thickness of Wire and Ribbon for Electronic Devices and Lamps — 5 стр.

Отменен

Standard Test Methods for Measuring Diameter or Thickness of Wire and Ribbon for Electronic Devices and Lamps (Withdrawn 2023) — 5 стр.

Отменен

Standard Specification for Fine Aluminum–;1 ;% Silicon Wire for Semiconductor Lead-Bonding (Withdrawn 2024) — 4 стр.

Действует

Standard Specification for Tungsten Wire for Electron Devices and Lamps — 5 стр.

Действует

Standard Specification for Molybdenum Wire and Rod for Electronic Applications — 4 стр.

Отменен

Standard Specification for Round Wire for Winding Electron Tube Grid Laterals (Withdrawn 2024) — 6 стр.

Заменен

Standard Test Methods for Measuring Diameter or Thickness of Wire and Ribbon for Electronic Devices and Lamps — 5 стр.

Заменен

Standard Test Methods for Measuring Diameter or Thickness of Wire and Ribbon for Electronic Devices and Lamps — 5 стр.

Заменен

Standard Test Methods for Measuring Diameter or Thickness of Wire and Ribbon for Electronic Devices and Lamps — 5 стр.

Заменен

Standard Test Methods for Measuring Diameter or Thickness of Wire and Ribbon for Electronic Devices and Lamps — 5 стр.

Отменен

Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps (Withdrawn 2023) — 3 стр.