Formerly under the jurisdiction of Committee F01 on Electronics, this test method was withdrawn in November 2023. This standard is being withdrawn without replacement because Committee F01 was disbanded.

3.1 Insulation resistance is useful for design verification, quality control of materials, and workmanship.

3.2 Low insulation resistance can cause high leakage currents.

3.3 High leakage currents can lead to deterioration of the insulation or false triggering of the associated input device, or both.

3.4 Specific areas of testing are, but not limited to:

3.4.1 Conductor/dielectric/conductor crossing point.

3.4.2 Close proximity of conductors, and

3.4.3 Any other conductive surface such as shielding or metal backing panel.

3.5 Insulation resistance measurement may be destructive and units that have been tested should be considered unreliable for future use.

1.1 This test method covers the determination of the insulation resistance of a membrane switch.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.3 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.