ASTM F1892-98

Заменен

Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices — 35 стр.

Ссылочные документы

ASTM E1249-00(2005)

Заменен

Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources — 16 стр.

ASTM E1250-88(2005)

Заменен

Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices — 11 стр.

ASTM E666-09

Заменен

Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation — 9 стр.

ASTM E668-05

Заменен

Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices — 19 стр.

ASTM E170-09

Заменен

Standard Terminology Relating to Radiation Measurements and Dosimetry — 9 стр.

ASTM F1892-04

Заменен

Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices — 39 стр.

На этот документ ссылаются

ASTM F1892-04

Заменен

Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices — 39 стр.