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СтандартыASTM

ASTM F26-87a(1999)

Отменен
Standard Test Methods for Determining the Orientation of a Semiconductive Single Crystal (Withdrawn 2003) — 5 стр.
ОписаниеСсылкиВерсии

Ссылочные документы

ASTM F26-87a(1999)
Отменен
Standard Test Methods for Determining the Orientation of a Semiconductive Single Crystal (Withdrawn 2003) — 5 стр.

На этот документ ссылаются

ASTM F1404-92(1999)
Заменен
Test Method for Crystallographic Perfection of Gallium Arsenide by Molten Potassium Hydroxide (KOH) Etch Technique — 6 стр.
ASTM F26-87a(1999)
Отменен
Standard Test Methods for Determining the Orientation of a Semiconductive Single Crystal (Withdrawn 2003) — 5 стр.
ASTM F1404-92(2007)
Отменен
Test Method for Crystallographic Perfection of Gallium Arsenide by Molten Potassium Hydroxide (KOH) Etch Technique (Withdrawn 2016) — 6 стр.
ASTM F76-08(2016)
Заменен
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors — 14 стр.
ASTM F76-08
Заменен
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors — 14 стр.
ASTM F76-08(2016)e1
Отменен
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors (Withdrawn 2023) — 14 стр.
ASTM F76-86(2002)
Заменен
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors — 13 стр.
ASTM F76-86(1996)e1
Заменен
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors — 13 стр.