Каталог стандартов
+7 (495) 223-46-76
+7 (812) 309-78-59
inform@normdocs.ru
О компании
Стандарты
Контакты
Заказать стандарт
Стандарты
ASTM
ASTM F390-98(2003)
Заменен
Standard Test Method for Sheet Resistance of Thin Metallic Films With a Collinear Four-Probe Array
— 4 стр.
Описание
Ссылки
Версии
Ссылочные документы
ASTM E1-07
Заменен
Standard Specification for ASTM Liquid-in-Glass Thermometers
— 64 стр.
ASTM F388-84
Отменен
Method for Measurement of Oxide Thickness on Silicon Wafers and Metallization Thickness by Multiple-Beam Interference (Tolansky Method) (Withdrawn 1993)
— 6 стр.
ASTM F390-11
Отменен
Standard Test Method for Sheet Resistance of Thin Metallic Films With a Collinear Four-Probe Array (Withdrawn 2020)
— 4 стр.
ASTM F390-98
Заменен
Standard Test Method for Sheet Resistance of Thin Metallic Films With a Collinear Four-Probe Array
— 4 стр.
На этот документ ссылаются
ASTM B488-01e1
Заменен
Standard Specification for Electrodeposited Coatings of Gold for Engineering Uses
— 8 стр.
ASTM B488-01
Заменен
Standard Specification for Electrodeposited Coatings of Gold for Engineering Uses
— 8 стр.
ASTM B488-01(2010)
Заменен
Standard Specification for Electrodeposited Coatings of Gold for Engineering Uses
— 8 стр.
ASTM B488-01(2006)
Заменен
Standard Specification for Electrodeposited Coatings of Gold for Engineering Uses
— 8 стр.
ASTM B488-95
Заменен
Standard Specification for Electrodeposited Coatings of Gold for Engineering Uses
— 8 стр.
ASTM F390-98
Заменен
Standard Test Method for Sheet Resistance of Thin Metallic Films With a Collinear Four-Probe Array
— 4 стр.
ASTM F390-11
Отменен
Standard Test Method for Sheet Resistance of Thin Metallic Films With a Collinear Four-Probe Array (Withdrawn 2020)
— 4 стр.
ASTM F1711-96
Заменен
Standard Practice for Measuring Sheet Resistance of Thin Film Conductors for Flat Panel Display Manufacturing Using a Four-Point Probe
— 8 стр.
ASTM F1711-96(2002)
Заменен
Standard Practice for Measuring Sheet Resistance of Thin Film Conductors for Flat Panel Display Manufacturing Using a Four-Point Probe
— 9 стр.