ASTM F418-77(2002)

Отменен

Standard Practice for Preparation of Samples of the Constant Composition Region of Epitaxial Gallium Arsenide Phosphide for Hall Effect Measurements (Withdrawn 2008) — 4 стр.

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ASTM F418-77(2002)

Отменен

Standard Practice for Preparation of Samples of the Constant Composition Region of Epitaxial Gallium Arsenide Phosphide for Hall Effect Measurements (Withdrawn 2008) — 4 стр.

ASTM F418-77(1996)e1

Заменен

Standard Practice for Preparation of Samples of the Constant Composition Region of Epitaxial Gallium Arsenide Phosphide for Hall Effect Measurements — 4 стр.

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ASTM F418-77(2002)

Отменен

Standard Practice for Preparation of Samples of the Constant Composition Region of Epitaxial Gallium Arsenide Phosphide for Hall Effect Measurements (Withdrawn 2008) — 4 стр.

ASTM F418-77(1996)e1

Заменен

Standard Practice for Preparation of Samples of the Constant Composition Region of Epitaxial Gallium Arsenide Phosphide for Hall Effect Measurements — 4 стр.

ASTM F76-08(2016)

Заменен

Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors — 14 стр.

ASTM F76-08

Заменен

Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors — 14 стр.

ASTM F76-08(2016)e1

Отменен

Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors (Withdrawn 2023) — 14 стр.

ASTM F76-86(2002)

Заменен

Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors — 13 стр.

ASTM F76-86(1996)e1

Заменен

Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors — 13 стр.