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ASTM
ASTM F43-99
Отменен
Standard Test Methods for Resistivity of Semiconductor Materials (Withdrawn 2003)
— 6 стр.
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ASTM F43-99
Отменен
Standard Test Methods for Resistivity of Semiconductor Materials (Withdrawn 2003)
— 6 стр.
На этот документ ссылаются
ASTM F43-99
Отменен
Standard Test Methods for Resistivity of Semiconductor Materials (Withdrawn 2003)
— 6 стр.
ASTM F76-08(2016)
Заменен
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
— 14 стр.
ASTM F76-08
Заменен
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
— 14 стр.
ASTM F76-08(2016)e1
Отменен
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors (Withdrawn 2023)
— 14 стр.
ASTM F76-86(2002)
Заменен
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
— 13 стр.
ASTM F76-86(1996)e1
Заменен
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
— 13 стр.