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ASTM F744M-97(2003)
Заменен
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]
— 6 стр.
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Ссылочные документы
ASTM E665-94
Отменен
Practice for Using Absorbed Dose Versus Depth in Materials to Verify the X-ray Output of Flash X-ray Machines (Withdrawn 2000)
— 4 стр.
ASTM E666-09
Заменен
Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation
— 9 стр.
ASTM E668-05
Заменен
Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
— 19 стр.
ASTM F526-97(2003)
Заменен
Standard Test Method for Measuring Dose for Use in Linear Accelerator Pulsed Radiation Effects Tests
— 11 стр.
ASTM F744M-10
Заменен
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]
— 7 стр.
ASTM F744M-97
Заменен
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits
— 6 стр.
На этот документ ссылаются
ASTM F744M-97
Заменен
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits
— 6 стр.
ASTM F744M-10
Заменен
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]
— 7 стр.