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ASTM F76-08(2016)e1

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Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors (Withdrawn 2023) — 14 стр.
ASTM F76-08(2016)
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ASTM F76-08
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ASTM F76-86(2002)
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ASTM F76-86(1996)e1
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ASTM F76-08(2016)e1
Отменен