Причина отмены This practice covered the measurement of the response of linear integrated circuits, under given operating conditions, to pulsed ionizing radiation. The response may be either transient or more lasting, such as latchup. The radiation source is either a flash X-ray machine (FXR) or an electron linear accelerator (LINAC).

Formerly under the jurisdiction of F01 on Electronics, this practice was withdrawn in November 2023. This standard is being withdrawn without replacement because Committee F01 was disbanded.

Значение и использование

5.1 There are many kinds of linear integrated circuits. Any given linear integrated circuit may be used in a variety of ways and under various operating conditions within the limits of performance specified by the manufacturer. The procedures of this practice provide a standardized way to measure the dose-rate response of a linear integrated circuit, under operating conditions similar to those of the intended application, when the circuit is exposed to pulsed ionizing radiation.

5.2 Knowledge of the responses of linear integrated circuits to radiation pulses is essential for the design, production, and maintenance of electronic systems that are required to operate in the presence of pulsed radiation environments.

Область применения

1.1 This practice covers the measurement of the response of linear integrated circuits, under given operating conditions, to pulsed ionizing radiation. The response may be either transient or more lasting, such as latchup. The radiation source is either a flash X-ray machine (FXR) or an electron linear accelerator (LINAC).

1.2 The precision of the measurement depends on the homogeneity of the radiation field and on the precision of the radiation dosimetry and the recording instrumentation.

1.3 The test may be considered to be destructive either for further tests or for other purposes if the total radiation ionizing dose exceeds some predetermined level or if the part should latch up. Because this level depends both on the kind of integrated circuit and on the application, a specific value must be agreed upon by the parties to the test. (See 6.10.)

1.4 Setup, calibration, and test circuit evaluation procedures are included in this practice.

1.5 Procedures for lot qualification and sampling are not included in this practice.

1.6 Because response varies with different device types, the dose rate range and device upset conditions for any specific test is not given in this practice but must be agreed upon by the parties to the test.

1.7 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.8 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.