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ASTM F980-92

Заменен
Guide for The Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices — 5 стр.
ОписаниеСсылкиВерсии

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Standard Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32 — 6 стр.
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ASTM F1032-91
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ASTM F980-92
Заменен
Guide for The Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices — 5 стр.

На этот документ ссылаются

ASTM F980M-96
Заменен
Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices [Metric] — 5 стр.
ASTM F980-92
Заменен
Guide for The Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices — 5 стр.
ASTM F1190-99
Заменен
Standard Guide for Neutron Irradiation of Unbiased Electronic Components — 5 стр.
ASTM F1190-93
Заменен
Standard Guide for Neutron Irradiation of Unbiased Electronic Components — 5 стр.