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ASTM F996-98

Заменен
Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics — 6 стр.
ASTM F996-98
Заменен
ASTM F996-98(2003)
Заменен
ASTM F996-10
Заменен
ASTM F996-11
Заменен
ASTM F996-11(2018)
Отменен