17/30355772 DC

Действует

BS EN 62047-33. Semiconductor devices. Micro-electromechanical devices. Part 33. MEMS piezoresistive pressure-sensitive device — 25 стр.

Ссылочные документы

Действует

Semiconductor devices. Semiconductor sensors. Pressure sensors — 22 стр.

Действует

Environmental testing - Part 2-1: Tests - Test A: Cold — 15 стр.

Действует

Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST — 19 стр.

Действует

Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling — 25 стр.

Действует

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state — 7 стр.

Заменен

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere — 9 стр.

Действует

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature — 8 стр.

Заменен

Electromagnetic compatibility (EMC) - Part 4-1: Testing and measurement techniques - Overview of IEC 61000-4 series — 31 стр.

Заменен

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock — 0 стр.

Отменен

Sampling plans and procedures for inspection by attributes — 69 стр.

Действует

Environmental testing - Part 2-10: Tests - Test J and guidance: Mould growth — 63 стр.

Действует

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure — 0 стр.

Заменен

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency — 0 стр.