18/30374539 DC

Действует

BS EN 60749-18. Semiconductor devices. Mechanical and climatic test methods. Part 18. Ionizing radiation (total dose) — 22 стр.

Описание Изменения Ссылки Версии

Ссылочные документы

ASTM E1249-15

Заменен

Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources — 17 стр.

ASTM E1250-15

Заменен

Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices — 10 стр.

ASTM F1892-12(2018)

Действует

Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices — 41 стр.

ASTM E666-14

Заменен

Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation — 9 стр.

ASTM E668-13

Заменен

Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices — 19 стр.