General requirements for a system for electronic components of assessed quality, Specification of procedures for the approval of an organization— 24 стр.
General requirements for a system for electronic components of assessed quality, Specification of lot formation, release procedures and certified test records— 14 стр.
General requirements for a system for electronic components of assessed quality, Specification of qualification approval and conformance testing procedures— 18 стр.
General requirements for a system for electronic components of assessed quality, Specification for the national implementation of the IECQ system— 8 стр.
General requirements for a system for electronic components of assessed quality, Specification of procedures for the approval of an organization— 19 стр.
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bipolar transistors for switching applications— 18 стр.
General requirements for a system for electronic components of assessed quality, Specification of procedures for the approval of an organization— 19 стр.
Specification for fixed capacitors of assessed quality: generic data and methods of test, Polycarbonate dielectric capacitors and polyethylene terephthalate dielectric capacitors for d.c. use and polypropylene dielectric capacitors for d.c. and a.c. use— 14 стр.
Detail specification for fixed metallized polyethylene terephthalate (PETP) film or metallized polycarbonate film dielectric capacitors. Rectangular non-metallic case axial or radial terminations, centrally spaced. Full assessment level— 14 стр.
General requirements for a system for electronic components of assessed quality, Specification for the national implementation of the IECQ system— 8 стр.
Detail specification for lead-screw actuated wirewound or non-wirewound preset potentiometers. Rectangular and square forms, container sealed, actuating device insulated from resistive element, slipping clutch at each end of travel. Full assessment level— 44 стр.
Specification for fixed capacitors of assessed quality: generic data and methods of test, Principles and mandatory procedures. General rules for drafting detail specifications— 52 стр.
