BS 9364 N013:1979

Отменен

Detail specification for low power silicon p-n-p switching transistors. 25 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level — 12 стр.

Описание Изменения Ссылки Версии

Ссылочные документы

BS 6001-0:2006

Заменен

Sampling procedures for inspection by attributes, Introduction to the BS 6001 (ISO 2859) series of standards for sampling for inspection by attributes — 20 стр.

BS 3934-5:1997

Действует

Mechanical standardization of semiconductor devices, Recommendations applying to tape automated bonding (TAB) of integrated circuits — 38 стр.

BS 9300 C841-849:1971

Отменен

Detail specification for silicon voltage regulator diodes — 12 стр.

BS 9000-7:1989

Действует

General requirements for a system for electronic components of assessed quality, Specification of lot formation, release procedures and certified test records — 14 стр.