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BS EN 60749-11:2002

Действует
Semiconductor devices. Mechanical and climatic test methods. Rapid change of temperature. Two-fluid-bath method — 12 стр.
ОписаниеИзмененияСсылкиВерсии

Ссылочные документы

IEC 60068-2-14:1984 ed5.0
Заменен
Environmental testing - Part 2: Tests. Test N: Change of temperature — 15 стр.
IEC 60749-30:2005+AMD1:2011 CSV ed1.1
Заменен
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing — 28 стр.
BS EN 60749-3:2002
Заменен
Semiconductor devices. Mechanical and climatic test methods. External visual examination — 8 стр.

На этот документ ссылаются

BS EN 60749-30:2005
Действует
Semiconductor devices. Mechanical and climatic test methods. Preconditioning of non-hermetic surface mount devices prior to reliability testing — 16 стр.
BS EN 62572-3:2014
Заменен
Fibre optic active components and devices. Reliability standards. Laser modules used for telecommunication — 22 стр.
BS EN 62149-2:2014
Действует
Fibre optic active components and devices. Performance standards. 850 nm discrete vertical cavity surface emitting laser devices — 24 стр.
BS EN 62572-3:2016
Действует
Fibre optic active components and devices. Reliability standards. Laser modules used for telecommunication — 24 стр.
BS EN 62149-8:2014
Действует
Fibre optic active components and devices. Performance standards. Seeded reflective semiconductor optical amplifier devices — 18 стр.
BS EN 60749-30:2005+A1:2011
Действует
Semiconductor devices. Mechanical and climatic test methods. Preconditioning of non-hermetic surface mount devices prior to reliability testing — 16 стр.
BS EN 60749:1999
Заменен
Semiconductor devices. Mechanical and climatic test methods — 80 стр.
ÖVE/ÖNORM EN 62149-8:2014-12
Действует
Fibre optic active components and devices - Performance standards - Part 8: Seeded reflective semiconductor optical amplifier devices (IEC 62149-8:2014) (english version)
ÖVE/ÖNORM EN 62149-2:2015-05
Действует
Fibre optic active components and devices - Performance standards - Part 2: 850 nm discrete vertical cavity surface emitting laser devices (IEC 62149-2:2014) (english version)
ÖVE/ÖNORM EN 60749-30:2012-02
Действует
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2005 + A1:2011) (english version)