BS EN 60749-15:2003

Заменен

Semiconductor devices. Mechanical and climatic test methods. Resistance to soldering temperature for through-hole mounted devices — 10 стр.

Ссылочные документы

Действует

Semiconductor devices. Mechanical and climatic test methods. Resistance to soldering temperature for through-hole mounted devices — 10 стр.

Заменен

Discrete semiconductor devices. Isolated power semiconductor devices — 56 стр.

Действует

Semiconductor devices. Mechanical and climatic test methods. Resistance to soldering temperature for through-hole mounted devices — 10 стр.

Действует

Semiconductor devices. Mechanical and climatic test methods. Solderability — 24 стр.

Заменен

Semiconductor devices. Mechanical and climatic test methods — 80 стр.