BS EN 60749-2:2002

Действует

Semiconductor devices. Mechanical and climatic test methods. Low air pressure — 10 стр.

Ссылочные документы

Заменен

Basic environmental testing procedures for electronic components and electronic equipment - Part 2: Tests - Test M: Low air pressure — 5 стр.

Действует

Environmental testing. Test methods. Tests. Test M. Low air pressure — 12 стр.

Заменен

Semiconductor devices. Mechanical and climatic test methods — 80 стр.