BS EN 60749-27:2006

Действует

Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Machine model (MM) — 16 стр.

Ссылочные документы

Заменен

Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM) — 18 стр.

Заменен

Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM) — 18 стр.

Заменен

Electrostatics. Protection of electronic devices from electrostatic phenomena. General requirements — 22 стр.

Действует

Semiconductor die products. Procurement and use — 46 стр.

Заменен

Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM) — 42 стр.

Действует

Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM) — 56 стр.

Действует

Electrostatics. Protection of electronic devices from electrostatic phenomena. General requirements — 24 стр.

Действует

Electrostatics. Methods for simulation of electrostatic effects. Machine model (MM) electrostatic discharge test waveforms — 12 стр.

Действует

Semiconductor devices. Micro-electromechanical devices. RF MEMS switches — 38 стр.

Действует

Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Machine model (MM) — 16 стр.

Действует

Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches (IEC 62047-5:2011) (english version)