BS EN 60749-3:2017

Действует

Semiconductor devices. Mechanical and climatic test methods. External visual examination — 16 стр.

Ссылочные документы

Действует

Semiconductor devices. Mechanical and climatic test methods. Permanence of marking — 12 стр.

Действует

Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking — 9 стр.

Заменен

Corrigendum 1 - Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements — 1 стр.

Действует

Environmental acceptance requirements for tin whisker susceptibility of tin and tin alloy surface finishes on semiconductor devices — 52 стр.

Заменен

Semiconductor devices. Mechanical and climatic test methods. External visual examination — 8 стр.

Действует

Electronic components. Long-term storage of electronic semiconductor devices. Die and wafer devices — 24 стр.

Действует

Semiconductor devices. Mechanical and climatic test methods. Power cycling — 12 стр.

Заменен

Semiconductor devices. Mechanical and climatic test methods. External visual examination — 8 стр.

Действует

Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling (IEC 60749-34:2010) (english version)