BS EN 60749-6:2002

Заменен

Semiconductor devices. Mechanical and climatic test methods. Storage at high temperature — 8 стр.

Ссылочные документы

Отменен

Environmental testing - Part 2: Tests. Guidance on the application of the tests of IEC 68 to simulate the effects of storage — 6 стр.

Действует

Semiconductor devices. Mechanical and climatic test methods. Storage at high temperature — 12 стр.

Заменен

Discrete semiconductor devices. Isolated power semiconductor devices — 56 стр.

Заменен

Fibre optic active components and devices. Reliability standards. Laser modules used for telecommunication — 22 стр.

Действует

Semiconductor devices. Mechanical and climatic test methods. Storage at high temperature — 12 стр.

Заменен

Semiconductor devices. Mechanical and climatic test methods — 80 стр.