BS EN 60749-8:2003

Действует

Semiconductor devices. Mechanical and climatic test methods. Sealing — 20 стр.

Ссылочные документы

Заменен

Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing — 52 стр.

Заменен

Fibre optic active components and devices. Reliability standards. Laser modules used for telecommunication — 22 стр.

Действует

Fibre optic active components and devices. Reliability standards. Laser modules used for telecommunication — 24 стр.

Действует

Semiconductor devices. Mechanical and climatic test methods. Robustness of terminations (lead integrity) — 18 стр.

Заменен

Semiconductor devices. Mechanical and climatic test methods — 80 стр.