BS EN 60749:1999

Заменен

Semiconductor devices. Mechanical and climatic test methods — 80 стр.

Ссылочные документы

BS EN 60335-2-11:2001

Заменен

Specification for safety of household and similar electrical appliances, Particular requirements for tumble dryers — 20 стр.

BS EN 60749-20:2003

Заменен

Semiconductor devices. Mechanical and climatic test methods. Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat — 28 стр.

BS EN 60749-22:2003

Действует

Semiconductor devices. Mechanical and climatic test methods. Bond strength — 24 стр.

BS EN 60749-31:2003

Действует

Semiconductor devices. Mechanical and climatic test methods. Flammability of plastic-encapsulated devices (internally induced) — 8 стр.

BS EN 60749-32:2003+A1:2010

Действует

Semiconductor devices. Mechanical and climatic test methods. Flammability of plastic-encapsulated devices (externally induced) — 8 стр.

BS EN 60749-5:2003

Заменен

Semiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test — 12 стр.

BS EN 60749-8:2003

Действует

Semiconductor devices. Mechanical and climatic test methods. Sealing — 20 стр.

BS EN 60749-1:2003

Действует

Semiconductor devices. Mechanical and climatic test methods. General — 12 стр.

BS EN 60749-4:2002

Заменен

Semiconductor devices. Mechanical and climatic test methods. Damp heat, steady state, highly accelerated stress test (HAST) — 12 стр.

BS EN 60749-6:2002

Заменен

Semiconductor devices. Mechanical and climatic test methods. Storage at high temperature — 8 стр.

BS EN 60749-7:2002

Заменен

Semiconductor devices. Mechanical and climatic test methods. Internal moisture content measurement and the analysis of other residual gases — 12 стр.

BS EN 60749-11:2002

Действует

Semiconductor devices. Mechanical and climatic test methods. Rapid change of temperature. Two-fluid-bath method — 12 стр.

BS EN 60749-3:2002

Заменен

Semiconductor devices. Mechanical and climatic test methods. External visual examination — 8 стр.

BS EN 60749-15:2003

Заменен

Semiconductor devices. Mechanical and climatic test methods. Resistance to soldering temperature for through-hole mounted devices — 10 стр.

BS EN 60749-13:2002

Заменен

Semiconductor devices. Mechanical and climatic test methods. Salt atmosphere — 10 стр.

BS EN 60749-21:2005

Заменен

Semiconductor devices. Mechanical and climatic test methods. Solderability — 24 стр.

BS EN 60749-14:2003

Действует

Semiconductor devices. Mechanical and climatic test methods. Robustness of terminations (lead integrity) — 18 стр.

BS EN 60749-12:2002

Заменен

Semiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency — 8 стр.

BS EN 60749-2:2002

Действует

Semiconductor devices. Mechanical and climatic test methods. Low air pressure — 10 стр.

BS EN 60749-25:2003

Действует

Semiconductor devices. Mechanical and climatic test methods. Temperature cycling — 16 стр.

BS EN 60749-36:2003

Действует

Semiconductor devices. Mechanical and climatic test methods. Acceleration, steady state — 8 стр.

BS EN 60749-10:2002

Действует

Semiconductor devices. Mechanical and climatic test methods. Mechanical shock — 8 стр.

BS EN 60749-19:2003+A1:2010

Действует

Semiconductor devices. Mechanical and climatic test methods. Die shear strength — 10 стр.

BS EN 60749-39:2006

Действует

Semiconductor devices. Mechanical and climatic test methods. Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components — 12 стр.

BS EN 60749-26:2006

Заменен

Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM) — 18 стр.

BS EN 60749-27:2006+A1:2012

Действует

Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Machine model (MM) — 16 стр.

BS EN 60749-9:2002

Заменен

Semiconductor devices. Mechanical and climatic test methods. Permanence of marking — 10 стр.

BS 6493-3:1985

Заменен

Semiconductor devices, Mechanical and climatic test methods — 42 стр.

На этот документ ссылаются

BS EN 60335-2-11:2001

Заменен

Specification for safety of household and similar electrical appliances, Particular requirements for tumble dryers — 20 стр.

BS 6493-3:1985

Заменен

Semiconductor devices, Mechanical and climatic test methods — 42 стр.