BS EN 62047-22:2014

Действует

Semiconductor devices. Micro-electromechanical devices. Electromechanical tensile test method for conductive thin films on flexible substrates — 12 стр.

Описание Изменения Ссылки Версии

Ссылочные документы

IEC 62047-2:2006 ed1.0

Действует

Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials — 25 стр.

IEC 62047-3:2006 ed1.0

Действует

Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing — 15 стр.

IEC 62047-8:2011 ed1.0

Действует

Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films — 36 стр.

ISO 527-3:1995

Заменен

Plastics. Determination of tensile properties. Part 3. Test conditions for films and sheets — 8 стр.

BS EN 62047-2:2006

Действует

Semiconductor devices. Micro-electromechanical devices. Tensile testing method of thin film materials — 16 стр.

BS EN 62047-3:2006

Действует

Semiconductor devices. Micro-electromechanical devices. Thin film standard test piece for tensile testing — 12 стр.

BS EN 62047-8:2011

Действует

Semiconductor devices. Micro-electromechanical devices. Strip bending test method for tensile property measurement of thin films — 22 стр.