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BS EN 62433-2:2017
Действует
EMC IC modelling. Models of integrated circuits for EMI behavioural simulation. Conducted emissions modelling (ICEM-CE)
— 110 стр.
Описание
Изменения
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Версии
Ссылочные документы
ISO 8879:1986
Действует
Information processing; Text and office systems; Standard Generalized Markup Language (SGML)
— 181 стр.
IEC 61967-4:2002 ed1.0
Заменен
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method
— 57 стр.
IEC 61967-2:2005 ed1.0
Действует
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
— 43 стр.
BS EN 61967-4:2002
Заменен
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz. Measurement of conducted emissions. 1 ohm/150 ohm direct coupling method
— 36 стр.
BS EN 61967-5:2003
Действует
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz. Measurement of conducted emissions. Workbench Faraday Cage method
— 28 стр.
IEC TS 62433-1:2011 ed1.0
Заменен
EMC IC modelling - Part 1: General modelling framework
— 22 стр.
BS EN 62433-2:2010
Заменен
EMC IC modelling. Models of integrated circuits for EMI behavioural simulation. Conducted emissions modelling (ICEM-CE)
— 46 стр.
На этот документ ссылаются
BS EN 62433-4:2016
Действует
EMC IC modelling. Models of integrated circuits for RF immunity behavioural simulation. Conducted immunity modelling (ICIM-CI)
— 112 стр.
BS EN 62433-2:2010
Заменен
EMC IC modelling. Models of integrated circuits for EMI behavioural simulation. Conducted emissions modelling (ICEM-CE)
— 46 стр.