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BS EN 62435-1:2017

Действует
Electronic components. Long-term storage of electronic semiconductor devices. General — 38 стр.
ОписаниеИзмененияСсылкиВерсии

Ссылочные документы

IEC 62258-1:2009 ed2.0
Действует
Semiconductor die products - Part 1: Procurement and use — 90 стр.
IEC 62258-2:2011 ed2.0
Действует
Semiconductor die products - Part 2: Exchange data formats — 141 стр.
IEC TS 61945:2000 ed1.0
Действует
Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis — 23 стр.
IEC TS 62668-2:2016 ed2.0
Заменен
Process management for avionics - Counterfeit prevention - Part 2: Managing electronic components from non-franchised sources — 46 стр.
IEC TS 62668-1:2016 ed3.0
Заменен
Process management for avionics - Counterfeit prevention - Part 1: Avoiding the use of counterfeit, fraudulent and recycled electronic components — 70 стр.
IEC 60068-2-17:1994 ed4.0
Заменен
Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing — 52 стр.
IEC TR 62258-3:2010 ed2.0
Действует
Semiconductor die products - Part 3: Recommendations for good practice in handling, packing and storage — 55 стр.
IEC 62402:2007 ed1.0
Заменен
Obsolescence management - Application guide — 77 стр.
IEC 62435-2:2017 ed1.0
Действует
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms — 36 стр.
IEC TR 62380:2004 ed1.0
Заменен
Reliability data handbook - Universal model for reliability prediction of electronics components, PCBs and equipment — 90 стр.
ISO 14644-9:2012
Действует
Cleanrooms and associated controlled environments -- Part 9: Classification of surface cleanliness by particle concentration — 34 стр.
IEC 62435-5:2017 ed1.0
Действует
Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices — 42 стр.
IEC 62258-5:2006 ed1.0
Действует
Semiconductor die products - Part 5: Requirements for information concerning electrical simulation — 24 стр.
IEC 60068-2-20:2008 ed5.0
Заменен
Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads — 40 стр.
IEC 60410:1973 ed1.0
Отменен
Sampling plans and procedures for inspection by attributes — 69 стр.
IEC TR 61340-5-2:2007/COR1:2009 ed1.0
Заменен
Corrigendum 1 - Electrostatics - Part 5-2: Protection of electronic devices from electrostatic phenomena - User guide — 0 стр.
IEC 61340-5-1:2007 ed1.0
Заменен
Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements — 38 стр.

На этот документ ссылаются

BS EN 62435-5:2017
Действует
Electronic components. Long-term storage of electronic semiconductor devices. Die and wafer devices — 24 стр.
BS EN IEC 62435-6:2018
Действует
Electronic components. Long-term storage of electronic semiconductor devices. Packaged or finished devices — 22 стр.