Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures). Generic data and methods of test— 154 стр.
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bidirectional triode thyristors (triacs), ambient or case-rated, up to 100 A— 16 стр.
Discrete semiconductor devices and integrated circuits. Blank detail specification for light emitting/infrared emitting diodes with/without pigtail for fibre optic systems and sub-systems— 16 стр.
Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures). Generic data and methods of test— 154 стр.
