Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 60749-23:2004 + A1:2011); German version EN 60749-23:2004 + A1:2011— 11 стр.
Letter symbols to be used in electrical technology - Part 2: Telecommunications and electronics (IEC 60027-2:2005); German version EN 60027-2:2007— 92 стр.
Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (IEC 60747-16-10:2004); German version EN 60747-16-10:2004— 56 стр.
Liquid crystal display devices - Part 10-1: Environmental, endurance and mechanical test methods - Mechanical (IEC 61747-10-1:2013); German version EN 61747-10-1:2013— 14 стр.
Terminology for voltage-sourced converters (VSC) for high-voltage direct current (HVDC) systems (IEC 62747:2014); German version EN 62747:2014— 32 стр.